Lee, Suhyeong
Kim, Sungmin
Kang, Hong Jeon
Kim, Hyun Woo
Seok, Ogyun https://orcid.org/0000-0002-8585-5002
Moon, Jeong Hyun
Bahng, Wook
Kim, Hyeong Joon
Ha, Min-Woo https://orcid.org/0000-0001-6593-227X
Funding for this research was provided by:
Korea Electrotechnology Research Institute (KERI) primary research program of MSIT/NST (19-12-N0101-48)
National Research Foundation of Korea (NRF) grant funded by the Korea government, MSIT (2017R1C1B5016033)
Article Title: Effect of sweeping direction on the capacitance−voltage behavior of sputtered SiO 2 /4H-SiC metal-oxide semiconductors after nitric oxide post-deposition annealing
Journal Title: Physica Scripta
Article Type: paper
Copyright Information: © 2019 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2019-05-08
Date Accepted: 2019-09-10
Online publication date: 2019-10-21