Karthik, Kadava R N https://orcid.org/0000-0002-0194-8341
Pandey, Chandan Kumar https://orcid.org/0000-0002-6177-6430
Article Title: Interfacial charge and temperature analysis of gate-all-around line tunneling TFET for improved device reliability
Journal Title: Physica Scripta
Article Type: paper
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Publication dates
Date Received: 2024-03-27
Date Accepted: 2024-06-20
Online publication date: 2024-07-02