Müller, Matthias
Beckhoff, Burkhard
Beyer, Edyta
Darlatt, Erik
Fliegauf, Rolf
Ulm, Gerhard
Kolbe, Michael https://orcid.org/0000-0001-9732-5757
Journal title: Metrologia
Article type: paper
Article title: Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant
Copyright information: © 2017 BIPM & IOP Publishing Ltd
Publication dates
Date received: 2017-03-16
Date accepted: 2017-05-17
Online publication date: 2017-08-04