,
Rigosi, Albert F https://orcid.org/0000-0002-8189-3829
Scherer, Hansjörg https://orcid.org/0000-0002-6287-5107
Taupin, Mathieu https://orcid.org/0000-0003-1770-914X
Callegaro, Luca https://orcid.org/0000-0001-5997-9960
He, Hans https://orcid.org/0000-0003-1962-5572
Kumar, Susmit https://orcid.org/0000-0002-5474-8095
Eichenberger, Ali https://orcid.org/0000-0002-2673-9052
Kruskopf, Mattias https://orcid.org/0000-0003-2846-3157
Yang, Yanfei https://orcid.org/0000-0003-0406-7416
Marzano, Martina https://orcid.org/0000-0001-5288-3093
Giblin, Stephen https://orcid.org/0000-0001-5667-5005
Rozhko, Sergiy https://orcid.org/0009-0007-2292-7818
Oe, Takehiko https://orcid.org/0000-0003-3424-1745
Chae, Dong-Hun https://orcid.org/0000-0001-6394-9182
Gournay, Pierre https://orcid.org/0000-0002-3040-3324
Article Title: Companion guide to the revised technical guidelines for reliable dc measurements of the quantized Hall resistance for graphene-based devices
Journal Title: Metrologia
Article Type: paper
Copyright Information: © 2026 The Author(s). Published on behalf of BIPM by IOP Publishing Ltd
Publication dates
Date Received: 2026-05-07
Date Accepted: 2026-05-12
Online publication date: 2026-06-02