Pearce, Ruth
Tan, Xinran
Wang, Rui
Patel, Trupti
Gallop, John
Pollard, Andrew
Yakimova, Rositsa
Hao, Ling
Funding for this research was provided by:
EU FET project graphene Flagship
National Measurement System (UK NMS programme)
European Metrology Research Programme (Graphohm and MetNEMS)
China Scholarship Council (CSC)
Journal title: Surface Topography: Metrology and Properties
Article type: paper
Article title: Investigations of the effect of SiC growth face on graphene thickness uniformity and electronic properties
Copyright information: © 2015 IOP Publishing Ltd
Publication dates
Date received: 2014-09-15
Date accepted: 2014-11-19
Online publication date: 2014-12-11