Peng, Zhenghan https://orcid.org/0000-0002-4832-136X
Uthman, Adeyemi https://orcid.org/0009-0001-3701-0654
Zhang, Zhepeng https://orcid.org/0000-0002-9870-0720
Hoang, Anh Tuan https://orcid.org/0000-0003-0911-1391
Zhu, Xiang
Pop, Eric https://orcid.org/0000-0003-0436-8534
Mannix, Andrew J https://orcid.org/0000-0003-4788-1506
Funding for this research was provided by:
National Science Foundation (ECCS-2026822)
Basic Energy Sciences (DE-AC02-76SF00515)
Stanford SystemX Alliance (TSMC)
Office of Naval Research (N000142512137)
Directorate for Engineering (2425218)
National Science Foundation MRI (2018008)
Article Title: Wide-field hyperspectral optical microscopy for rapid characterization of two-dimensional semiconductors and heterostructures
Journal Title: 2D Materials
Article Type: paper
Copyright Information: © 2026 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2025-09-01
Date Accepted: 2026-01-06
Online publication date: 2026-02-19