Lin (林振), Z
Brunkov, P
Bassani, F
Descamps, A
O’Dwyer, C
Bremond, G
Journal title: Materials Research Express
Article type: paper
Article title: Carrier trapping study on a Ge nanocrystal by two-pass lift mode electrostatic force microscopy
Copyright information: © 2015 IOP Publishing Ltd
Publication dates
Date received: 2014-10-31
Date accepted: 2015-01-21
Online publication date: 2015-02-17