Singh, D
Kumar, R
Ganguli, T
Major, S S
Journal title: Materials Research Express
Article type: paper
Article title: High resolution x-ray diffraction study of the substrate temperature and thickness dependent microstructure of reactively sputtered epitaxial ZnO films
Copyright information: © 2017 IOP Publishing Ltd
Publication dates
Date received: 2017-07-11
Date accepted: 2017-08-24
Online publication date: 2017-09-07