Gritsenko, V A https://orcid.org/0000-0003-1646-0848
Gismatulin, A A https://orcid.org/0000-0003-3177-6226
Baraban, A P https://orcid.org/0000-0001-8745-7019
Сhin, A
Funding for this research was provided by:
Russian Science Foundation (18-49-08001)
Ministry of Science and Technology, Taiwan (107-2923-E-009-001-MY3)
Russian state research (0306-2019-0005)
Journal title: Materials Research Express
Article type: paper
Article title: Mechanism of stress induced leakage current in Si3N4
Copyright information: © 2019 IOP Publishing Ltd
Publication dates
Date received: 2019-02-13
Date accepted: 2019-03-21
Online publication date: 2019-04-03