Funding for this research was provided by:
Yayasan Universiti Teknologi PETRONAS Fundamental Research Grant (015CL0-069)
Article Title: Single event burnout hardening of trench shielded power UMOSFET using High-κ dielectrics
Journal Title: Materials Research Express
Article Type: paper
Copyright Information: © 2020 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2020-01-16
Date Accepted: 2020-03-19
Online publication date: 2020-03-30