Abdullah, Isam https://orcid.org/0000-0003-3645-1906
Emyr Macdonald, J https://orcid.org/0000-0001-5504-1692
Lin, Yen-Hung https://orcid.org/0000-0001-6819-1235
Anthopoulos, Thomas D https://orcid.org/0000-0002-0978-8813
Salah, Nasih Hma
Anwar Kakil, Shaida https://orcid.org/0000-0002-9031-6521
Muhammadsharif, Fahmi F
Article Title: Bias stability of solution-processed In2O3 thin film transistors
Journal Title: Journal of Physics: Materials
Article Type: paper
Copyright Information: © 2020 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2020-07-18
Date Accepted: 2020-10-29
Online publication date: 2020-11-17