Sumaiya, Saima A https://orcid.org/0000-0002-2386-7446
Martini, Ashlie https://orcid.org/0000-0003-2017-6081
Baykara, Mehmet Z https://orcid.org/0000-0002-0278-6022
Funding for this research was provided by:
Air Force Office of Scientific Research (FA9550-19-1-0035)
Article Title: Improving the reliability of conductive atomic force microscopy-based electrical contact resistance measurements
Journal Title: Nano Express
Article Type: paper
Copyright Information: © 2020 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2020-10-20
Date Accepted: 2020-11-16
Online publication date: 2020-11-25