Scholten, Sam C https://orcid.org/0000-0001-8494-9341
Iwański, Jakub https://orcid.org/0000-0003-2395-4010
Xing, Kaijian https://orcid.org/0000-0001-5254-4710
Binder, Johannes https://orcid.org/0000-0002-0461-7716
Dąbrowska, Aleksandra K https://orcid.org/0000-0003-4633-2054
Tan, Hark H https://orcid.org/0000-0002-7816-537X
Cheng, Tin S
Bradford, Jonathan https://orcid.org/0000-0003-2356-5816
Mellor, Christopher J https://orcid.org/0000-0001-5987-7876
Beton, Peter H https://orcid.org/0000-0002-2120-8033
Novikov, Sergei V https://orcid.org/0000-0002-3725-2565
Krotkus, Simonas https://orcid.org/0000-0002-3072-1381
Mischke, Jan
Yengel, Emre
Henning, Alex https://orcid.org/0000-0003-0419-4992
Pasko, Sergej
Wysmołek, Andrzej https://orcid.org/0000-0002-8302-2189
Tetienne, Jean-Philippe https://orcid.org/0000-0001-5796-2508
Funding for this research was provided by:
Australian National Fabrication Facility
National Science Centre, Poland (2022/47/B/ST5/03314)
Australian Research Council (CE200100010)
German Federal Ministry of Education and Research (16ME0398K)
Engineering and Physical Sciences Research Council UK (EP/V05323X/1)
Article Title: Optically detected magnetic resonance of wafer-scale hexagonal boron nitride thin films
Journal Title: Materials for Quantum Technology
Article Type: paper
Copyright Information: © 2025 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2025-09-01
Date Accepted: 2025-11-12
Online publication date: 2025-12-03