Platier, B http://orcid.org/0000-0003-4524-0131
van de Wetering, F M J H http://orcid.org/0000-0002-0134-4468
van Ninhuijs, M A W http://orcid.org/0000-0002-0577-3403
Brussaard, G J H
Banine, V Y http://orcid.org/0000-0001-6676-7421
Luiten, O J http://orcid.org/0000-0003-2048-4455
Beckers, J http://orcid.org/0000-0001-6116-7013
Journal title: Journal of Physics D: Applied Physics
Article type: error
Article title: Addendum: Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy (2018 J. Phys: D. Appl. Phys. 52 034004)
Copyright information: © 2020 IOP Publishing Ltd
Publication dates
Date received: 2020-03-31
Date accepted: 2020-05-01
Online publication date: 2020-06-17