Pétry, J http://orcid.org/0000-0003-4678-9839
Boeck, B De
Sebaïhi, N
Coenegrachts, M
Caebergs, T http://orcid.org/0000-0001-6985-0909
Dobre, M http://orcid.org/0000-0002-5193-0238
Article Title: Uncertainty evaluation in atomic force microscopy measurement of nanoparticles based on statistical mixed model in a Bayesian framework
Journal Title: Measurement Science and Technology
Article Type: paper
Copyright Information: © 2021 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2020-12-16
Date Accepted: 2021-02-09
Online publication date: 2021-05-19