Zwiebler, M
Hamann-Borrero, J E
Vafaee, M
Komissinskiy, P
Macke, S
Sutarto, R
He, F
Büchner, B
Sawatzky, G A
Alff, L
Geck, J
Funding for this research was provided by:
WD Western Economic Diversification Canada
Government of Saskatchewan
Natural Sciences and Engineering Research Council of Canada
National Research Council Canada
Canada Foundation for Innovation
Canadian Institutes of Health Research
DFG Emmy Noether Program (GE-1647/2)
DFG (HA6470/1-1)
University of Saskatchewan
Journal title: New Journal of Physics
Article type: paper
Article title: Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity
Copyright information: © 2015 IOP Publishing Ltd and Deutsche Physikalische Gesellschaft
License information: cc-by Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Publication dates
Date received: 2015-01-20
Date accepted: 2015-07-13
Online publication date: 2015-08-24