Das, Avishek http://orcid.org/0000-0002-9250-8287
Article Title: An easy-to-fabricate source measure unit for real-time DC and time-varying characterization of multi-terminal semiconductor devices
Journal Title: Engineering Research Express
Article Type: paper
Copyright Information: © 2021 IOP Publishing Ltd
Publication dates
Date Received: 2020-11-15
Date Accepted: 2020-12-23
Online publication date: 2021-01-06