Kim, Tae Hyeon
Park, Sung Su
Kang, Min Su
Kim, Ye Rin
Park, Ho Seok
Kim, Hyun-seung https://orcid.org/0000-0001-6670-4500
Jeong, Goojin https://orcid.org/0000-0002-4946-5664
Funding for this research was provided by:
Korea Evaluation Institute of Industrial Technology (20011905)
Article Title: Accelerated Degradation of SiO/NCM Cell Quick Rechargeability Due to Depth-of-Discharge Range Dependent Failure Induced Li Dendrite Formation
Journal Title: Journal of The Electrochemical Society
Article Type: paper
Copyright Information: © 2022 The Electrochemical Society (“ECS”). Published on behalf of ECS by IOP Publishing Limited. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2021-11-17
Date Accepted:
Online publication date: 2022-02-22