Ceric, H. https://orcid.org/0000-0003-0918-7732
Selberherr, S.
Zahedmanesh, H.
de Orio, R. L.
Croes, K.
Article Title: Review—Modeling Methods for Analysis of Electromigration Degradation in Nano-Interconnects
Journal Title: ECS Journal of Solid State Science and Technology
Article Type: paper
Copyright Information: © 2021 The Author(s). Published on behalf of The Electrochemical Society by IOP Publishing Limited
Publication dates
Date Received: 2020-12-21
Date Accepted:
Online publication date: 2021-03-04