Nagano, F. https://orcid.org/0000-0001-5315-8694
Inoue, F.
Phommahaxay, A.
Peng, L.
Chancerel, F.
Naser, H.
Beyer, G.
Uedono, A.
Beyne, E.
De Gendt, S.
Iacovo, S.
Article Title: Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
Journal Title: ECS Journal of Solid State Science and Technology
Article Type: paper
Copyright Information: © 2023 The Author(s). Published on behalf of The Electrochemical Society by IOP Publishing Limited
Publication dates
Date Received: 2022-12-27
Date Accepted: 2023-02-21
Online publication date: 2023-03-02