Article Title: Investigation on Effect of Interface Trap Charges and Temperature in Gate Overlap Graphene Source Step Shape Double Gate Tunnel FET
Journal Title: ECS Journal of Solid State Science and Technology
Article Type: paper
Copyright Information: © 2023 The Electrochemical Society (“ECS”). Published on behalf of ECS by IOP Publishing Limited
Publication dates
Date Received: 2023-05-24
Date Accepted:
Online publication date: 2023-08-10