Kim, Tae Hyeon
Park, Sung Su
Kang, Min Su
Kim, Ye Rin
Park, Ho Seok
Kim, Hyun-seung http://orcid.org/0000-0001-6670-4500
Jeong, Goojin http://orcid.org/0000-0002-4946-5664
Funding for this research was provided by:
Korea Evaluation Institute of Industrial Technology (20011905)
Article Title: Accelerated Degradation of SiO/NCM Cell Quick Rechargeability Due to Depth-of-Discharge Range Dependent Failure Induced Li Dendrite Formation
Journal Title: Journal of The Electrochemical Society
Article Type: paper
Copyright Information: © 2022 The Electrochemical Society (“ECS”). Published on behalf of ECS by IOP Publishing Limited
Publication dates
Date Received: 2021-11-17
Date Accepted:
Online publication date: 2022-02-22