Islam, Zahabul
Haque, Aman
Glavin, Nicholas
Xian, Minghan
Ren, Fan
Polyakov, Alexander Y. http://orcid.org/0000-0001-6898-6126
Kochkova, Anastasia
Tadjer, Marko
Pearton, S. J. http://orcid.org/0000-0001-6498-1256
Funding for this research was provided by:
Defense Threat Reduction Agency (HDTRA1-17-1-0011)
National Science Foundation (NSF DMR 1856662)
Office of Naval Research (N00014-15-1-2392)
Russian Science Foundation (19-19-00409)
Article Title: In Situ Transmission Electron Microscopy Observations of Forward Bias Degradation of Vertical Geometry β-Ga2O3 Rectifiers
Journal Title: ECS Journal of Solid State Science and Technology
Article Type: paper
Copyright Information: © 2020 The Author(s). Published on behalf of The Electrochemical Society by IOP Publishing Limited
Publication dates
Date Received: 2020-05-19
Date Accepted: 2020-05-26
Online publication date: 2020-06-08