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Application of silicon micro hall sensors in variable temperature scanning hall probe microscopy (SHPM) using multiple feedback techniques

Crossref DOI link: https://doi.org/10.21833/ijaas.2018.06.011

Published Online: 2018-06

Published Print: 2018-06

Update policy: https://doi.org/10.21833/ijaas-crossmark

Authors

,

Akram, Rizwan
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This paper is maintained by: IASE www.science-gate.com

Paper Title: Application of silicon micro hall sensors in variable temperature scanning hall probe microscopy (SHPM) using multiple feedback techniques

Journal Title: International Journal of Advanced and Applied Sciences

CrossRef DOI link to publisher maintained version: https://doi.org/10.21833/ijaas.2018.06.011

Content Type: Article

Copyright: © 2018 The Authors. Published by IASE. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).