NANOSCALE INVESTIGATION OF LOCAL ELECTRICAL PROPERTIES AND SCHOTTKY CONTACTS IN ALUMINUM-DOPED ZINC OXIDE THIN FILMS USING CONDUCTIVE ATOMIC FORCE MICROSCOPY
Crossref DOI link: https://doi.org/10.30574/ijsra.2026.20.3.1723
Published Online: 2026-09-30
Update policy: https://doi.org/10.30574/ijsra.ourcrossmarkpolicy
Shaibo, Jamal
