CTS-Aware Voltage Scaling Across Distributed Corners: A New Approach to Clock Robustness in Sub-5nm SoCs
Crossref DOI link: https://doi.org/10.30574/wjaets.2026.18.3.0104
Published Online: 2026-03-31
Update policy: https://doi.org/10.30574/wjaets.ourcrossmarkpolicy
Adibhatla, Phaneendra Chainulu Sri