Takeuchi, Kiyoshi https://orcid.org/0000-0002-8392-1029
Kobayashi, Masaharu https://orcid.org/0000-0002-7945-6136
Hiramoto, Toshiro https://orcid.org/0000-0001-9469-2631
Article Title: A simulation study on low voltage operability of hafnium oxide based ferroelectric FET memories
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2020 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2019-10-01
Date Accepted: 2020-01-16
Online publication date: 2020-02-28