Funding for this research was provided by:
Science Challenge Project (TZ2016003-1)
Journal title: Japanese Journal of Applied Physics
Article type: paper
Article title: Total-ionizing-dose induced enhanced hot-carrier injection effect in the 130 nm partially depleted SOI I/O nMOSFETs
Copyright information: © 2020 The Japan Society of Applied Physics
Publication dates
Date received: 2019-06-20
Date accepted: 2020-01-26
Online publication date: 2020-02-17