Mizutani, Tomoko
Takeuchi, Kiyoshi https://orcid.org/0000-0002-8392-1029
Saraya, Takuya
Kobayashi, Masaharu https://orcid.org/0000-0002-7945-6136
Hiramoto, Toshiro https://orcid.org/0000-0001-9469-2631
Article Title: Statistical analysis of temperature dependence of worst case static random access memory data retention voltage using extreme value theory
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2020 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2019-10-01
Date Accepted: 2020-01-23
Online publication date: 2020-02-28