Wada, Yuhei
Nozaki, Mikito
Hosoi, Takuji
Shimura, Takayoshi
Watanabe, Heiji
Journal title: Japanese Journal of Applied Physics
Article type: paper
Article title: Insight into gate dielectric reliability and stability of SiO2/GaN MOS devices
Copyright information: © 2020 The Japan Society of Applied Physics
Publication dates
Date received: 2019-12-27
Date accepted: 2020-03-13
Online publication date: 2020-04-01