Wada, Yuhei
Nozaki, Mikito
Hosoi, Takuji
Shimura, Takayoshi
Watanabe, Heiji
Article Title: Insight into gate dielectric reliability and stability of SiO 2 /GaN MOS devices
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2020 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2019-12-27
Date Accepted: 2020-03-13
Online publication date: 2020-04-01