Tominaga, Takaaki
Iwamatsu, Toshiaki
Nakao, Yukiyasu
Amishiro, Hiroyuki
Watanabe, Hiroshi
Miura, Naruhisa
Yamakawa, Satoshi
Nakata, Shuhei
Article Title: Influence of recovery characteristics on switching behavior of SiC MOSFETs
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2020 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2020-05-14
Date Accepted: 2020-07-09
Online publication date: 2020-07-30