Article Title: Impact of fast and slow transient charging effect on reliability instability in In 0.7 Ga 0.3 As quantum-well MOSFETs with high- κ dielectrics
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2020 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2020-09-16
Date Accepted: 2020-10-09
Online publication date: 2020-10-22