Journal title: Japanese Journal of Applied Physics
Article type: lett
Article title: Impact of fast and slow transient charging effect on reliability instability in In0.7Ga0.3As quantum-well MOSFETs with high-κ dielectrics
Copyright information: © 2020 The Japan Society of Applied Physics
Publication dates
Date received: 2020-09-16
Date accepted: 2020-10-09
Online publication date: 2020-10-22