Yao, Yongzhao https://orcid.org/0000-0002-7746-4204
Sugawara, Yoshihiro https://orcid.org/0000-0002-0004-0112
Ishikawa, Yukari https://orcid.org/0000-0001-8908-7592
Hirano, Keiichi https://orcid.org/0000-0001-9105-3746
Funding for this research was provided by:
New Energy and Industrial Technology Development Organization (N/A)
Nippon Sheet Glass Foundation for Materials Science and Engineering (N/A)
the NAGAI Foundation for Science & Technology (N/A)
Knowledge Hub Aichi (N/A)
Japan Society for the Promotion of Science (20K05355)
Article Title: X-ray topography of crystallographic defects in wide-bandgap semiconductors using a high-resolution digital camera
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2021 The Japan Society of Applied Physics
Publication dates
Date Received: 2020-11-03
Date Accepted: 2020-12-10
Online publication date: 2021-01-07