Oshima, Kunihiro
Bian, Song
Kuribara, Kazunori https://orcid.org/0000-0003-2746-1467
Sato, Takashi https://orcid.org/0000-0002-1577-8259
Article Title: Separation of bias stress degradation between insulator and semiconductor carrier trapping in organic thin-film transistors
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2021 The Japan Society of Applied Physics
Publication dates
Date Received: 2020-10-16
Date Accepted: 2021-01-15
Online publication date: 2021-02-16