Zheng, Dong-Guang https://orcid.org/0000-0001-8337-788X
Shim, Jong-In https://orcid.org/0000-0002-1305-074X
Shin, Dong-Soo https://orcid.org/0000-0002-0863-9138
Funding for this research was provided by:
Korea Evaluation Institute of Industrial Technology (20004475)
Article Title: Analysis of degradation mechanisms in GaN-based light-emitting diodes under reverse-bias stress: effects of defects and junction-temperature increase
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2021 The Japan Society of Applied Physics
Publication dates
Date Received: 2020-12-21
Date Accepted: 2021-02-18
Online publication date: 2021-03-08