Lou, Zaiqi
Saito, Wataru
Nishizawa, Shin-ichi
Article Title: Investigation of acceptable breakdown voltage variation for parallel-connected SiC MOSFETs during unclamped inductive switching test
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2021 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2020-10-16
Date Accepted: 2021-03-03
Online publication date: 2021-03-24