Islam, Mahfuzul https://orcid.org/0000-0002-5011-4044
Harada, Shogo
Article Title: On-chip leakage current variation measurement using external-reference-free current-to-time conversion for densely placed MOSFETs
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2022 The Japan Society of Applied Physics
Publication dates
Date Received: 2021-09-30
Date Accepted: 2022-01-31
Online publication date: 2022-02-23