Hasegawa, Rimpei
Kita, Koji http://orcid.org/0000-0002-3753-8125
Article Title: Characterization of deep traps in the near-interface oxide of widegap metal–oxide–semiconductor interfaces revealed by light irradiation and temperature change
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2022 The Japan Society of Applied Physics
Publication dates
Date Received: 2022-01-01
Date Accepted: 2022-04-06
Online publication date: 2022-04-28