Yoshizu, Ryohei
Sumita, Kei
Toprasertpong, Kasidit https://orcid.org/0000-0003-4206-8698
Takenaka, Mitsuru https://orcid.org/0000-0002-9852-1474
Takagi, Shinichi https://orcid.org/0000-0002-5601-2604
Article Title: Accurate evaluation of interface trap density at InAs MOS interfaces by using C–V curves at low temperatures
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2023 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2022-10-14
Date Accepted: 2023-01-09
Online publication date: 2023-02-15