Xu, Jinghan
Fan, Mengqi
Sun, Zixuan
Liu, Fei
Liu, Xiaoyan
Article Title: Simulation study of trap-induced noise characteristics in FDSOI MOSFETs
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2024 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2023-10-13
Date Accepted: 2024-02-12
Online publication date: 2024-03-05