Eyben, Pierre https://orcid.org/0000-0003-3686-556X
De Keersgieter, An
Matagne, Philippe
Chiarella, Thomas
Porret, Clément
Hikavyy, Andriy
Siew, Yong Kong
Goux, Ludovic
Mitard, Jérôme
Horiguchi, Naoto
Article Title: Predictive and prospective calibrated TCAD to improve device performances in sub-20 nm gate length p-FinFETs
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2024 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2023-10-16
Date Accepted: 2024-02-18
Online publication date: 2024-03-18