Sanyal, Surjava https://orcid.org/0009-0000-8852-8114
Lin, Qinchen
Shih, Timothy
Zhang, Shijie
Wang, Guangying
Mukhopadhyay, Swarnav
Vigen, Jonathan
Zhang, Wentao
Pasayat, Shubhra S
Gupta, Chirag
Article Title: Corrigendum: “Significant reduction in sidewall damage related external quantum efficiency (EQE) drop in red InGaN microLEDs (∼625 nm at 1 A cm−2) with device sizes down to 3 μm” [Jpn. J. Appl. Phys. 63 030904 (2024)]
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2024 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2024-10-07
Date Accepted: 2024-10-08
Online publication date: 2024-10-23