Kobayashi, Daichi
Fukuzawa, Ryota https://orcid.org/0000-0002-1330-3989
Shigekawa, Naoteru https://orcid.org/0000-0001-7454-8640
Liang, Jianbo
Takahashi, Takuji https://orcid.org/0000-0001-9177-7568
Article Title: Cross-sectional investigation by dual bias modulation electrostatic force microscopy on Si/Si junction fabricated by surface-activated bonding
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2025 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2024-11-22
Date Accepted: 2025-03-17
Online publication date: 2025-04-03