Shimura, Ryotaro
Nako, Eishin
Matsumoto, Koji https://orcid.org/0000-0003-3312-8564
Suzuki, Akihiro
Yamamoto, Hiroaki
Matsukawa, Kazuhito
Takenaka, Mitsuru https://orcid.org/0000-0002-9852-1474
Takagi, Shinichi https://orcid.org/0000-0002-5601-2604
Toprasertpong, Kasidit https://orcid.org/0000-0003-4206-8698
Article Title: Interface trap density evaluation of off-angle Si(110)/SiO 2 MOS structures
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2026 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2025-10-28
Date Accepted: 2026-01-14
Online publication date: 2026-02-06