Mizutani, Tomoko https://orcid.org/0000-0002-2358-3945
Takeuchi, Kiyoshi https://orcid.org/0000-0002-8392-1029
Saraya, Takuya
Inaba, Takumi https://orcid.org/0000-0002-7380-7265
Oka, Hiroshi https://orcid.org/0000-0002-6571-3461
Asai, Hidehiro
Mori, Takahiro
Kobayashi, Masaharu https://orcid.org/0000-0002-7945-6136
Hiramoto, Toshiro https://orcid.org/0000-0001-9469-2631
Article Title: Anomalous variability of subthreshold characteristics in bulk and silicon on insulator MOSFETs at cryogenic temperatures
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2026 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2025-10-24
Date Accepted: 2026-01-22
Online publication date: 2026-02-16