Takahashi, Takanori
Fujii, Mami N. https://orcid.org/0000-0001-8112-3288
Miyanaga, Ryoko
Miyanaga, Miki
Ishikawa, Yasuaki
Uraoka, Yukiharu
Funding for this research was provided by:
Tateishi Science and Technology Foundation (2191028)
Journal title: Applied Physics Express
Article type: lett
Article title: Unique degradation under AC stress in high-mobility amorphous In–W–Zn–O thin-film transistors
Copyright information: © 2020 The Japan Society of Applied Physics
Publication dates
Date received: 2020-04-01
Date accepted: 2020-04-13
Online publication date: 2020-04-23