Ma, Qiang
Urano, Shiyo
Ando, Yuji
Tanaka, Atsushi
Wakejima, Akio
Article Title: Impact of SiN passivation film stress on electroluminescence characteristics of AlGaN/GaN high-electron-mobility transistors
Journal Title: Applied Physics Express
Article Type: paper
Copyright Information: © 2021 The Japan Society of Applied Physics
Publication dates
Date Received: 2021-05-25
Date Accepted: 2021-08-18
Online publication date: 2021-09-02