Shoji, Tomoyuki
Narita, Tetsuo https://orcid.org/0000-0002-0849-360X
Nagasato, Yoshitaka
Kanechika, Masakazu https://orcid.org/0000-0002-9761-8610
Kondo, Takeshi
Uesugi, Tsutomu https://orcid.org/0000-0003-1631-0364
Tomita, Kazuyoshi https://orcid.org/0000-0002-7919-5116
Ikeda, Satoshi
Mori, Tomohiko
Yamaguchi, Satoshi https://orcid.org/0000-0003-3531-124X
Kimoto, Yasuji
Kojima, Jun
Suda, Jun https://orcid.org/0000-0002-5453-4943
Article Title: Analysis of intrinsic reverse leakage current resulting from band-to-band tunneling in dislocation-free GaN p–n junctions
Journal Title: Applied Physics Express
Article Type: paper
Copyright Information: © 2021 The Japan Society of Applied Physics
Publication dates
Date Received: 2021-08-30
Date Accepted: 2021-09-24
Online publication date: 2021-10-06