Ogasahara, Yasuhiro http://orcid.org/0000-0003-2718-1756
Kuribara, Kazunori http://orcid.org/0000-0003-2746-1467
Sato, Takashi http://orcid.org/0000-0002-1577-8259
Article Title: Measurement of 64 organic thin-film transistors in an array test structure using a relay-switch board for efficient evaluation of long-term reliability
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2023 The Japan Society of Applied Physics
Publication dates
Date Received: 2022-10-20
Date Accepted: 2022-12-22
Online publication date: 2023-01-23