Monochromatic ligth of short wavelength as applied to determine (N+/P/P+) Silicon solar cell base thickness under the influence of both magnetic field and temperature
Crossref DOI link: https://doi.org/10.53430/ijeru.2022.3.2.0055
Published Online: 2022-10-30
Update policy: https://doi.org/10.53430/osj.ourcrossmarkpolicy
Sega DIAGNE,
Gora DIOP,
Richard MANE,
Malick NDIAYE,
Ibrahima DIATTA,
Gilbert N DIONE,
Ousmane SOW,
Moustapha THIAME,
Mamadou WADE,
Gregoire SISSOKO,
